Product Introduction

● In situ spot characterization of paraxial optical path

● Spectrometer and beam analyzer

The wavelength coverage range is 10~80nm

● Quick and easy integration

● Compact multifunctional device

NanoLIGHT is a complete characterization instrument for in situ periodic sampling of XUV beams. NanoLIGHT combines the functions of XUV spectrometer and XUV beam analyzer, and can completely retract the beam bypass. It can quickly and automatically switch between various working modes.

With its compact structure of 16x17cm ², nanoLIGHT is suitable for small experimental setups and is a perfect retrofit solution.

NanoLIGHT can simultaneously record a wide wavelength range of 10-80nm, and its filter insertion unit allows the use of metal filters for selection and calibration.

The MCP detector with adjustable sensitivity and full spectrum grating efficiency of up to 20% enables the spectrometer to have a large dynamic range.

Customized cavity versions of nanoLIGHT are available for selection!

　　Technical parameters:

Grating efficiency:

Application

High-order harmonic source

Aces Science

Interaction between intense laser and matter

Free electron laser